*[µSD]: micro SD
*[ADC]: Analog-to-Digital Converter *[BSP]: Board Software/Support Package *[CAN]: Controller Area Network *[CPU]: Central Processing Unit *[CRC]: Cyclic Redundancy Check *[CS]: Chip Select *[DAC]: Digital-to-Analog Converter *[ECC]: Error Correction Code *[exFAT]: Extensible File Allocation Table *[FAT]: File Allocation Table
*[FSP]: Flexible Software Package *[GPIO]: General Purpose Input and Output *[HAL]: Hardware Abstraction Layer
*[ITM]:Instrumentation Trace Macrocell *[JTAG]: Joint Test Action Group *[LED]: Light Emitting Diode *[MCU]: Microcontroller Unit *[MISO]: Master In Slave Out *[MOSI]: Master Out Slave In
*[NTFS]: New Technology File System *[PICO]: Peripheral In; Ccontroller Out *[POCI]: Peripheral Out; Controller In *[PWM]: Pulse Width Modulation *[QSPI]: Quad-SPI *[RAM]: Random-Access Memory *[RST]: Reset *[RTC]: Realtime Clock *[RX]: Receive *[SCK]: Serial Clock *[SCL]: Serial Clock *[SD]: Secure Digital *[SDA]: Serial Data *[SDHC]: Secure Digital High Capacity *[SDI]: Serial Data In *[SDIO]: Serial Data In/Out *[SDO]: Serial Data Out *[SDUC]: Secure Digital Ultra Capacity *[SDXC]: Secure Digital Extended Capacity *[SPI]: Serial Peripheral Interface *[SRAM]: Static Random-Access Memory *[SS]: Slave Select *[SWCLK]: Serial Wire Clock *[SWD]: Serial Wire Debug *[SWDIO]: Serial Wire Data Input/Output *[SWO]: Serial Wire Output *[SWV]: Serial Wire Viewer *[TCK]: Test Clock *[TDI]: Test Data In *[TDO]: Test Data Out *[TMS]: Test Mode Select *[TRST]: Test Reset *[TX]: Transmit *[UART]: Universal Asynchronous Receiver-Transmitter *[WDT]: Watchdog Timer